The nanoscale dynamic mechanical analysis (nanoDMA) technique is accomplished on a nanoindenter with a dynamic mechanical testing package and heating/cooling stage. It is performed by superimposing a small sinusoidal load on top of a larger quasi-static load during a nanoindentation test. The resultant total indentation displacement into the sample, the dynamic displacement amplitude, and the phase shift from the dynamic load input are recorded and analyzed to yield storage modulus, loss modulus, tangent delta and other mechanical properties and characteristics of the material surfaces.

The nanoDMA technique can be applied for characterizing viscoelastic materials for time dependent properties under controlled temperatures. Typical properties obtained via this powerful technique include complex modulus, storage modulus, loss modulus, tangent delta, frequency dependence, strain rate effect, temperature influence, depth profile, etc.

The new nanoDMA III technology, provided with the Bruker Hysitron TI-980, provides a substantial upgrade over the older technique with the new CMX mode for continuous measurement of a wide range of mechanical properties. Properties such as hardness, loss modulus, tan delta, etc. can be measured as a function of time, frequency, and contact depth. Creep tests can also be performed in which a constant force has a small oscillation superimposed over it. The control software allows tremendous flexibility in adding both quasistatic and dynamic components to the dynamic mechanical test.

Typical Experimental Results

nanodma

Silicone Rubber 1

nanodma

Silicone Rubber 2

nanodma

Polycarbonate

Applications

Complex Modulus Compression Controlled Force/Strain Rate
Creep Compliance Equilibrium Recoverable Compliance Film Analysis
Frequency Effect Glass Transition Isostrain
Loss Modulus Multi-Frequency Relaxation Modulus
Sample Stiffness Secondary Transitions Static/Dynamic Force
Storage Modulus Storage/Loss Compliance Stress Relaxation
Stress/Strain Behavior Tan Delta Viscoelastic Characterization

For more information please read our application notes:

Instrument: Bruker Hysitron TI-980

Key Specifications

Max Dynamic Force Amplitude 5 mN
Max Dynamic Displacement Amplitude 2.5 um
Displacement Resolution 0.02 nm
Force Range 30 nN to 10 mN
Force Resolution 1 nN
Frequency Range 0.1 to 300 Hz
Atmosphere Open Air, Inert Gas

Instrument: Multi-Technique and Full-Feature Nanoindentation System

instrument

Key Specifications

Temperature Range 5 to 300 °C
Displacement Resolution 0.02 nm
Force Range 30 nN to 10 mN
Force Resolution 1 nN
Frequency Range 1 to 300 Hz
Atmosphere Open Air, Inert Gas