The Hysitron TriboIndenter, which can perform nanoindentation and nanoscratch testing, has the capability to perform in-situ scanning probe microscopy (SPM). The TriboIndenter’s piezo scanner can scan a probe tip across a sample surface up to 60 µm wide and at a maximum rate of 3 Hz. The setpoint applied during scanning is typically 1-2 µN. Analysis software, such as SIP or Hysitron’s TriboView, calculate surface roughness parameters from imported SPM images.
Typical Experimental Results
SPM image of a grid pattern
3D render of a grid pattern converted from SPM image
A SPM image of a scratch on a hard drive platter and a SPM image of a rubber surface
Rubber Surface Roughness Parameters Calculated with TriboView Analysis Software
Scan Area
|
400 µm^2
|
RMS (Rq)
|
170.703 nm
|
Average Roughness (Ra)
|
137.135 nm
|
Max Height
|
730.156 nm
|
Min Height
|
-492.650 nm
|
Peak-Valley
|
1222.810 nm
|
SPM image of a 10 µm wide wear crater
Line profile across the 10 µm wear crater generated in TriboView analysis software
Applications
10 Peak Height
|
Average Surface Roughness
|
Crack Length
|
Critical Dimensions
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Density of Summits
|
Grip Material
|
Line Profile
|
Material Coating
|
Material Finishing
|
Material Removal
|
Morphology
|
Nano Features
|
Peak to Peak
|
Peak to Valley |
RMS Roughness
|
For more information please read our application notes:
Surface Roughness and Morphological Analysis Through Scanning Probe Microscopy
Instrument: Hysitron TriboIndenter SPM
Key Specifications
Max Scan Area | 60 µm |
Max Scan Rate | 3 Hz |
Scan Lines per Image | 256 |
Probe Tip Geometry | Berkovich, Cube Corner, Conical |
Probe Material | Diamond |
ASTM Number | Title | Website Link |
E2859-11 | Standard Guide for Size Measurement of Nanoparticles using Atomic Force Microscopy | Link |
E1813-96 | Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy | Link |
ISO Number | Title | Website Link |
3274 | Gemoetrical Product Specifications (GPS)– Surface texture: Profile method– Nominal characteristics of contact (stylus) instruments | Link |
8503-4 | Preparation of steel substrates before application of paints and related products– Surface roughness characteristics of blast-cleaned steel substrates– Part 4: Method for the calibration of ISO surface profile comparators and for the determination of surface profile– Stylus instrument procedure | Link |
25319 | Sintered metal materials, excluding hardmetals– Measurement of surface roughness | Link |