AFM Atomic Force Microscopy is a technique used for observing surface characteristics such as surface roughness and morphology as well as force measurement.
FTIR Fourier Transform Infrared Microscopy is a technique used to identify chemical structures and molecules. It is commonly used to analyze failures, polymers, materials, contamination, and general investigations.
Optical

Optical microscopy can be accomplished through various instruments equipped in the NAT Lab. The Zeiss Axioscope, AmScope Stereo Microscope, TriboIndenter camera system and CSM camera system can all be perform microscopy on a wide variety of samples.
Raman Raman Microscopy is a technique for observing chemical structures and molecules. This method is similar, but complimentary to FTIR microscopy.
SEM

The JEOL 6610LV can produce high resolution images under either secondary electron mode or a backscattered electron mode for surface topography and composition analysis. The SEM is expected to further expand NAT Lab’s portfolio offerings in surface morphology, metallurgy, particle sizing, surface roughness and micro/nano dimensional measurement areas.
SPM

The Hysitron TriboIndenter, which can perform nanoindentation and nanoscratch testing, has the capability to perform in-situ scanning probe microscopy (SPM).